Monte Carlo analysis of a 2nd-order curvature-compensated CMOS bandgap voltage reference
Electron Devices and Solid-State Circuits（2011）
摘要
This work presents a 2nd-order curvature-compensated CMOS bandgap voltage reference, which utilizes the constant current technique. Monte Carlo analysis is done to estimate the performance impact from the process variation and device mismatch. Finally, the circuit is implemented in a standard 0.18 μm CMOS process. The measurement results have confirmed that the proposed bandgap voltage reference operates with a supply voltage of 1.8 V, consuming 52 μW at room temperature (25 °C), and the temperature coefficient of the output voltage reference is about 8 ppm/°C from -40 °C to 125 °C. The measured power supply rejection ratio is -42 dB at 1 kHz.
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关键词
process variation,cmos process,cmos integrated circuits,bandgap voltage reference,device mismatch,power supply rejection ratio,constant current technique,monte carlo analysis,constant current sources,voltage 1.8 v,size 0.18 mum,monte carlo methods,temperature 293 k to 298 k,power 52 muw,frequency 1 khz,reference circuits,curvature compensated,gain -42 db,2nd-order curvature-compensated cmos bandgap voltage reference,temperature -40 degc to 125 degc,room temperature
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