Fault Localization with Partially Reliable Test Results Using Dempster-Shafer Theory
TASE '14 Proceedings of the 2014 Theoretical Aspects of Software Engineering Conference (tase 2014)(2014)
摘要
Fault localization is a critical procedure in software development process. Previous studies based their research on the precondition that test results are conveniently acquired and 100% correct, which does not happen in the real world. In this article, we propose the concept of gamma-reliable test-suite to demonstrate the potential unreliability of test results. By modeling this unreliability using Dempster-Shafer theory, we managed to pin down the faults under the new situation. Experiments were conducted on both 100%-reliable and partial-reliable Siemens Test Suite and compared against several known spectrum-based localization algorithms, namely Naish1, Naish2, Binary, Wong1 and Russel&Rao. The results proved the prior performance of our approach. We conclude that fault localization problem is more precisely modeled by Dempster-Shafer theory than common statistical theory.
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关键词
dempster-shafer theory, partial reliable test results, fault localization,wong1,program testing,binary,naish1,statistical theory,inference mechanisms,dempster-shafer theory,spectrum-based localization algorithms,russel&rao,partial reliable test results,fault localization,partial-reliable siemens test suite,γ-reliable test-suite,fault localization problem,software development process,fault location,software engineering,naish2,testing,reliability theory,uncertainty,estimation,accuracy
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