A novel capacitive-coupled floating gate antenna protection design and its application to prevent in-process charging effects for 3D NAND flash memory

VLSI Technology, 2014, Pages 1-2.

Cited by: 1|Bibtex|Views5|DOI:https://doi.org/10.1109/VLSIT.2014.6894400
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Abstract:

In-process charging effect is found to deteriorate the initial Vt distribution of 3D NAND Flash. In this work, we propose a novel antenna protection circuit using a capacitive coupled floating gate (CCFG) CMOS circuit that can be applied to the word line (WL), string select (SSL) and ground select transistor (GSL) decoders. Experimental r...More

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