How to avoid random walks in hierarchical test path identification

ETW '00 Proceedings of the IEEE European Test Workshop, pp. 111-116, 2000.

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Abstract:

Hierarchical test approaches address the complexity of test generation through symbolic reachability paths that provide access to the I/Os of each module in a hierarchical design. While transparency behavior suitable for symbolic design traversal can be utilized for datapath modules, control modules do not exhibit transparency, and theref...More

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