A proposed measurement of controlled defect induction and annealing in a carbon nanotube

Shonan Village（2008）

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摘要

We propose controlled creation and annealing of defects in carbon nanotubes by plasma and current application, respectively. TEM is used to map nanoparticles, which nucleate at defect sites and act as position markers.

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关键词

annealing,carbon nanotubes,crystal defects,nucleation,carbon nanotube,controlled defect induction,plasmas,materials,physics

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