Measurement Of The Transverse Electric Field Profile Of Light By A Self-Referencing Method With Direct Phase Determination

OPTICS EXPRESS(2012)

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摘要
We present a method for measuring the transverse electric field profile of a beam of light which allows for direct phase retrieval. The measured values correspond, within a normalization constant, to the real and imaginary parts of the electric field in a plane normal to the direction of propagation. This technique represents a self-referencing method for probing the wavefront characteristics of light. (C)2012 Optical Society of America
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关键词
metrology,phase retrieval
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