Photorefractive damage resistance threshold in stoichiometric LiNbO 3 :Zr crystals

Optics letters(2013)

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摘要
Several optical methods including ultraviolet absorption, infrared absorption of the hydroxyl ions, Raman spectroscopy, and the Z-scan method have been used to determine the damage resistance threshold in 0-0.72 mol. % Zr-containing, flux-grown, nearly stoichiometric LiNbO3 single crystals. All spectroscopical methods used indicate that samples containing at least approximate to 0.085 mol: % Zr in the crystal are above the threshold while Z-scan data locate the photorefractive damage threshold between 0.085 and 0.314 mol. % Zr. (C) 2013 Optical Society of America
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关键词
photorefractive damage resistance threshold,linbo_3zr crystals,stoichiometric linbo_3zr
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