Simultaneous Dynamic Electrical And Structural Measurements Of Functional Materials

C Vecchini,P Thompson,Michael A Stewart,A Muñiz-Piniella,Sean R C Mcmitchell,Jeffrey M Wooldridge,Serban Lepadatu,L Bouchenoire, Steven J Brown,Didier Wermeille,Oier Bikondoa,C A Lucas,T P A Hase, M Lesourd, D Dontsov,M G Cain

REVIEW OF SCIENTIFIC INSTRUMENTS（2015）

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摘要

A new materials characterization system developed at the XMaS beamline, located at the European Synchrotron Radiation Facility in France, is presented. We show that this new capability allows to measure the atomic structural evolution (crystallography) of piezoelectric materials whilst simultaneously measuring the overall strain characteristics and electrical response to dynamically (ac) applied external stimuli. (C) 2015 AIP Publishing LLC.

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