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Ultrafast Patterning of Nanoparticles by Electrostatic Lithography

Journal of vacuum science & technology B, Microelectronics and nanometer structures(2006)

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摘要
Electron beam lithography is one of the best tools for patterning nanostructures, but its usage is limited due to slow processing. To enhance the patterning speed, the authors used a low dose electron beam to generate a “latent” charge pattern image and then create a real pattern by attaching positively charged particles by electrospray. Hard baked 2.3μm thick polymethylmethacrylate substrates were irradiated with a 2keV electron beam with a dose of 50nC∕cm2. Positively charged silver nanoparticles were generated by an electrospray technique in which a nanoparticle solution mixed with hexane was sprayed through a 15μm diameter capillary tip with an applied potential of 4.5kV. Charged nanoparticles were deposited to the charge patterned sites by electrostatic attraction with a resolution of 0.7μm. This patterning approach, which we call “electrostatic lithography,” represents a speed increase of ∼20 times over standard fast electron beam resists that require typical doses of 1μC∕cm2. This approach may lead to a general capability for ultrafast patterning of nanomaterial building blocks including nanoparticles and nanotubes without requiring additional etching or other processing steps.
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