Experimental observation of local electrical signature of suspended graphene grown via chemical vapour deposition method

We employ electrostatic force microscope (EFM) techniques to explore local electrical properties of suspended graphene on Cu foil, SiO2/Si and PET substrate. By using electrical modulation of amplitude in a tapping mode atomic force microscope tip, we can obtain distinguished electrostatic force amplitude mapping of graphene on various substrates. In particular, at nano-valley domains on Cu and a SiO2/Si surface, relatively weaker electrostatic attractive interaction is observed than at nano-peak domains. In SiO2/Si, we find that electrostatic force distribution of graphene still follows the substrate surface morphology. Furthermore, employing EFM to graphene on a PET system can be suggested as a facile tool to investigate electrical performance of graphene.