The role of topography and friction for the image contrast in lateral force microscopyStefan Grafstrom,M Neitzert, Teus Hagen,Jorg Ackermann,R Neumann,O Probst,M WortgeNanotechnology（1993）引用 96|浏览4暂无评分关键词physical model,indium tin oxideAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
