Large-Scale, Nonsubtractive Patterning Of Transparent Conducting Oxides By Ion Bombardment

APPLIED PHYSICS LETTERS(2011)

引用 3|浏览5
暂无评分
摘要
While significant progress has been achieved in the fabrication and performance of transparent electronic devices, substantially less research effort has been devoted to transparent interconnects, despite their critical importance for transparent integrated circuitry. Here, we exploit the crystal disorder induced by Ar(1) ion bombardment to achieve efficient fabrication of electrically conductive patterns on indium oxide surfaces. The resulting ion-induced patterns are characterized by conductive atomic force microscopy, secondary ion mass spectrometry, and four-point charge transport measurements. Massively parallel patterning is demonstrated over square centimeter areas with a patterned electrical conductivity of similar to 10(4) S cm(-1). (C) 2011 American Institute of Physics. [doi: 10.1063/1.3610444]
更多
查看译文
关键词
ion beam,fabrication,opacity,mass spectroscopy,surfaces,thin film,crystals,materials science,secondary ion mass spectrometry,point charge,mass spectra,thin films,atomic force microscopy,electric conductivity
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要