Anomalous X-ray scattering using third-generation synchrotron radiation

In this paper, we discuss the recent development of anomalous X-ray scattering (AXS) technique as a tool of investigating local structures of non-crystalline materials using a third-generation synchrotron radiation facility, ESRF. In order to obtain differential structure factors with a high statistical quality, it is necessary to acquire scattering data with a good energy resolution to discriminate elastic signals from fluorescence and Compton scattering intensities, as well as with a sufficient number of scattered X-ray photons. For this we chose a single-crystal graphite energy-analyzer with a long detector arm. In order to show the feasibility of this detecting system, we describe in detail examples of our recent AXS results on As2Se3 chalcogenide glass and (As2Se3)(0.4)(AgI)(0.6) superionic glass.