Effect of Fluorinated Al₂O₃ Gate Dielectrics using F-based Neutral Beam IncorporationSung Woo Kim,Byoung Jae Park,Se Koo Kang,Tae Hong Min,Geun Young Yeommag(2008)引用 23|浏览5暂无评分关键词high kAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要