Terahertz Induced Electromigration

Peter Uhd Jepsen,Krzysztof Iwaszczuk,Maksim Zalkovskij,Andrew C Strikwerda

19th International Conference on Ultrafast Phenomena (2014), paper 08.Tue.P2.42（2014）

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摘要

We report the first observation of THz-field-induced electromigration in sub-wavelength metallic gap structures after exposure to intense single-cycle, sub-picosecond electric field transients of amplitude up to 400 kV/cm.

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