Bias-Temperature Instabilities in Silicon Carbide MOS DevicesD M Fleetwood,En Xia Zhang,Xiao Shen,Cher Xuan Zhang,R D Schrimpf,Sokrates T PantelidesBias Temperature Instability for Devices and Circuits(2014)引用 6|浏览20暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要