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Lattice distortion analysis of nonpolar a-plane (11\bar 20) GaN films by using a grazing-incidence X-ray diffraction technique

yong gon seo
yong gon seo
[0]
jihoon kim
jihoon kim
[0]
sungmin hwang
sungmin hwang
[0]
soohwan jang
soohwan jang
[0]
heesan kim
heesan kim
kwang hyeon baik
kwang hyeon baik
[0]

Journal of the Korean Physical Society, 2015.

Cited by: 0|Bibtex|Views0|DOI:https://doi.org/10.3938/jkps.66.607
Other Links: academic.microsoft.com

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