Optical and surface probe investigation of secondary phases in Cu 2 ZnSnS 4 films grown by electrochemical deposition

Cu2ZnSnS4 (CZTS) films were grown by electrochemical deposition, and we measured the work function of the as-grown and of the KCN-etched CZTS surfaces by using Kelvin probe force microscopy (KPFM) and micro-Raman scattering spectroscopy with incident laser wavelengths of 488.0 and 632.8nm, respectively, and the results indicate that a secondary phase formed at different depths. The KPFM measurements can discriminate phase uniformity at the nano-scale. Secondary phases, such as Cu2−xS (0更多