The Impact of Vpass Interference on Charging-Trapping NAND Flash Memory DevicesMarkkuangyeu hsieh[0]chihyuan lu[0]kuopin chang[0]weichen chen[0]hangting lue[0]yihsuan hsiao[0]bingyue tsui[0]IEEE Transactions on Device and Materials Reliability, 2015.Cited by: 0|Bibtex|Views18Other Links: academic.microsoft.comCode: Data: Full Text (Upload PDF)PPT (Upload PPT)Upload PDFUpload PPTYour rating :0 TagsCommentsSubmit
