Impact of ${\hbox{V}}_{\rm pass} $ Interference on Charge-Trapping NAND Flash Memory DevicesYihsuan Hsiao,Hangting Lue,Weichen Chen,Kuopin Chang,Bingyue Tsui,Kuangyeu Hsieh,Chihyuan LuIEEE Transactions on Device and Materials Reliability(2015)引用 25|浏览48暂无评分关键词materials,logic gates,computer architecture,interferenceAI 理解论文溯源树样例生成溯源树,研究论文发展脉络