The Measurements Of Spectral Reflectance Spatial Distribution On Mc-Si Solar Cell Surface

Measurement results of spectral reflectance spatial distribution on multi-crystalline silicon solar cells surface are presented. The optical measurement apparatus employs a specific designed micro-spectral reflectance meter. It is suitable for working in visible wavelength range; measurable sample size can be as small as 0.06mm. Results of reflectance distribution on me-Si solar cell are presented as a spatial sampling interval of 0.1 mm. The peak values of spectral reflectance appear about 400nm wavelength and vary from 10% to 30% with the spatial position on solar cell.