A low overhead error confinement method based on application statistical characteristics

DATE, pp. 1168-1171, 2016.

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Abstract:

Reliability has emerged as a critical design constraint especially in memories. Designers are going to great lengths to guarantee fault free operation of the underlying silicon by adopting redundancy-based techniques, which essentially try to detect and correct every single error. However, such techniques come at a cost of large area, pow...More

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