A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns

Reliability Engineering & System Safety, pp. 55-63, 2016.

Cited by: 13|Views20
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Abstract:

Motivated by the two-phase degradation phenomena observed in light displays (e.g., plasma display panels (PDPs), organic light emitting diodes (OLEDs)), this study proposes a new degradation-based burn-in testing plan for display products exhibiting two-phase degradation patterns. The primary focus of the burn-in test in this study is to ...More

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