L attice distortion an alysis of nonpol ar a-pl ane $(11\b ar 20)$ G aN films by using a gr azing-incidence X-r ay diffr action technique

Journal of the Korean Physical Society, pp. 607-611, 2015.

Cited by: 0|Bibtex|Views0|DOI:https://doi.org/10.3938/jkps.66.607
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Abstract:

This work examines the anisotropic microstructure and the lattice distortions of nonpolar a-plane \((11\bar 20)\) GaN (a-GaN) films by using the grazing-incidence X-ray diffraction technique. Faulted a-GaN films typically exhibit an in-plane anisotropy of the structural properties along the X-ray in-beam directions. For this reason, the a...More

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