Runtime NBTI Mitigation for Processor Lifespan Extension via Selective Node Control

ATS, pp. 234-239, 2016.

Cited by: 4|Views18
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Abstract:

Negative bias temperature instability (NBTI) has become one of the major reliability concerns for nanoscale CMOS technology. The NBTI effect degrades pMOS transistors by stressing them with negatively biased voltage, while the transistors heal themselves as the negative bias is removed. In this paper, we propose a cross-layer mitigation t...More

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