A multidimensional features fault diagnosis method for analog circuits

IECON, pp. 382-387, 2016.

Cited by: 0|Views4


In view of the fact that the integration of ICs is becoming higher and accessible testing nodes are getting less, circuit testing is becoming more and more difficult. A multidimensional feature fault diagnosis method based on principal component analysis is proposed in this paper. On the basis of analyzing the fault feature of analog circ...More



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