An Optimized Test During Burn-In for Automotive SoC.
IEEE Design & Test(2018)
摘要
Early life failures have to be excluded to fulfill the high reliability needs of automotive electronics. While burn-in test may be an effective technique, it is also a very significant cost factor. This article presents strategies for stress test parallelization.
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关键词
Failure analysis,Random access memory,Logic gates,Flash memories,Automotive engineering,Reliability engineering
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