Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction

Christoph Mahr,Knut Müller-Caspary,Robert Ritz,Martin Simson,Tim Grieb,Marco Schowalter,Florian F. Krause,Anastasia Lackmann,Heike Soltau,Arne Wittstock,Andreas Rosenauer

Ultramicroscopy（2019）

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摘要

•Measurement and correction of diffraction pattern distortions.•Influence of diffraction pattern distortions on measurements of strain.•Influence of diffraction pattern distortions on measurements of tetragonal distortions.•Comparison of two techniques for the detection of diffraction disc positions.

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关键词

Strain measurement,Electron diffraction,Image distortions,4D-STEM,Nanoporous gold

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