Remote sensing based yield monitoring: Application to winter wheat in United States and Ukraine

International Journal of Applied Earth Observation and Geoinformation(2019)

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摘要
•We present a new method to monitor wheat yield using daily MODIS DVI.•We test the model over the USA and Ukraine from 2001 to 2017.•We can monitor the yield at the subnational level with a RMSE lower than 0.6 MT/ha.•The RMSE at the national scale is 0.1 MT/ha for the US and 0.2 MT/ha for Ukraine.•The model captures low winter wheat yields during years with extreme weather events.
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关键词
Yield model,MODIS,DVI,Evaporative Fraction
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