Characterization of Polycrystalline Silicon Thin-Film Transistors with Nickel-Titanium Oxide Gate Dielectric Coating by Sol-Gel Method S. C. Wu, R. C. Yen, C. K. Deng,T. S. Chao,S. H. Chuang,T. F. LeiThe Japan Society of Applied Physics（2009）引用 1|浏览4暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
