Investigation of BTI degradation in LDMOS transistorsY. Ikeda, H. Mori,Takashi Kato,Taiki Uemura, M. Yoshida, M. Onoda,Hideya MatsuyamaThe Japan Society of Applied Physics(2012)引用 0|浏览9暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要