Defect analysis and performance evaluation of p-type epitaxial GaAs layer on Ge substrate for GaAs/Ge based advanced deviceGoutam Kumar Dalapati,Vignesh Suresh,Sandipan Chakraborty,Chandreswar Mahata,Yi Ren, Thirumaleshawara Bhat,S. Tripathy,Taeyoon Lee,Lakshmi Kanta Bera,D. Z. ChiAdvanced Materials Letters(2016)引用 3|浏览13暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要