Finite Element Analysis of Fabrication- and Operation-Induced Mechanical Stress in AlGaN/GaN Transistors

Sameer Joglekar, Chuanxin Lian, Rajesh Baskaran, Yan Zhang,Tomas Palacios, Allen Hanson

IEEE Transactions on Semiconductor Manufacturing(2016)

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摘要
Mechanical stress is an important factor influencing the performance and reliability of GaN-based devices. In highly piezoelectric materials like AlGaN/GaN, mechanical stress directly influences the piezoelectric polarization, and hence the charge density of the 2-D electron gas. Fabrication processes for devices as well as device operating conditions can change the mechanical stress in AlGaN/GaN ...
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关键词
Stress,Aluminum gallium nitride,Wide band gap semiconductors,Silicon nitride,HEMTs,Gallium nitride
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