Probing thermal expansion coefficients of monolayers using surface enhanced Raman scattering
RSC Advances(2016)
摘要
Monolayer transition metal dichalcogenides exhibit remarkable electronic and optical properties, making them candidates for application within flexible nano-optoelectronics, however direct experimental determination of their thermal expansion coefficients (TECs) is difficult. Here, we propose a non-destructive method to probe the TECs of monolayer materials using surface-enhanced Raman spectroscopy (SERS). A strongly coupled Ag nanoparticle over-layer is used to controllably introduce temperature dependent strain in monolayers. Changes in the first-order temperature coefficient of the Raman shift, produced by TEC mismatch, can be used to estimate relative expansion coefficient of the monolayer. As a demonstration, the linear TEC of monolayer WS2 is probed and is found to be 10.3 × 10−6 K−1, which would appear support theoretical predictions of a small TEC. This method opens a route to probe and control the TECs of monolayer materials.
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