Application level investigation of system-level ESD-induced soft failures

Sandeep Vora,Rui Jiang,Shobha Vasudevan,Elyse Rosenbaum

2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)（2016）

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摘要

Hardware and application level manifestations of ESD soft failures were characterized for a single-board computer and similar products. Failures associated with the peripheral ICs occur independent of the application being run; the application-dependent failures are attributed to noise at the CPU.

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关键词

system-level ESD-induced soft failures,application level investigation,single-board computer,peripheral IC failure,application-dependent failures,CPU noise

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