Lifetime And Substrate Doping Measurements Of Solar Cells And Application To In-Line Process Control
2016 IEEE 43RD PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)(2016)
摘要
Advanced cell characterization, through the measurement of effective lifetime and substrate doping at the cell level, as a supplement to conventional cell test parameters and an application to in-line solar cell testing is discussed in this paper. A variety of solar cell samples including Al BSF, monocrystalline PERC, and multi-crystalline PERC cells were measured using the Sinton Instruments FCT-750. This in-line solar cell tester performs a Suns-Voc, injection-dependent lifetime, and substrate doping measurement to supplement the conventional cell test results. The importance of the effective lifetime and doping advanced characterization for in-line measurements will be discussed in this paper.
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关键词
charge carrier lifetime,current-voltage characteristics,doping,photovoltaic cells,silicon
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