Advanced Methodology For Measuring The Extensive Elastic Compliance And Mechanical Loss Directly In K(31) Mode Piezoelectric Ceramic Plates

Dielectric, elastic, and piezoelectric constants, and their corresponding losses are defined under constant conditions of two categories; namely, intensive (i.e., E, electric field or T, stress), and extensive (i.e., D, dielectric displacement or x, strain) ones. So far, only the intensive parameters and losses could be measured directly in a k(31) mode sample. Their corresponding extensive parameters could be calculated indirectly using the coupling factor and "K" matrix. However, the extensive loss parameters, calculated through this indirect method, could have large uncertainty, due to the error propagation in calculation. In order to overcome this issue, extensive losses should be measured separately from the measurable intensive ones in lead-zirconate-titanate (PZT) k(31) mode rectangular plate ceramics. We propose a new mechanical-excitation methodology, using a non-destructive testing approach by means of a partial electrode configuration, instead of the conventional full electrode configuration. For this purpose, a non-electrode sample was prepared, where the electrode covered only 10% of the top and bottom surfaces at the center to actuate the whole sample, and also monitor the responding vibration. The admittance spectrum of this sample, corresponds to PZT properties under dielectric displacement D constant condition. Furthermore, ceramics with partial-electrodes were also prepared to create short and open circuit boundary conditions, attributing to resonance and anti-resonance modes. In the proposed way, we were able to measure both intensive and extensive elastic compliances and mechanical losses directly for the first time. The accuracy of this new method is compared with the conventional measurements by use of indirect calculations. The preliminary results (by neglecting the 10% actuator part difference at this point) were obtained, which were in good agreements (less than 3% difference) with the previous indirect method. Published by AIP Publishing.