High-Performance GaN Vertical Fin Power Transistors on Bulk GaN Substrates

IEEE Electron Device Letters(2017)

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摘要
This letter reports a GaN vertical fin power field-effect-transistor structure with submicron fin-shaped channels on bulk GaN substrates. In this vertical transistor design only n-GaN layers are needed, while no material regrowth or p-GaN layer is required. A combined dry/wet etch was used to get smooth fin vertical sidewalls. The fabricated transistor demonstrated a threshold voltage of 1 V and s...
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关键词
Gallium nitride,Logic gates,Field effect transistors,Substrates,Silicon,Electrodes
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