Thermally Active Screw Dislocations in Si, SiC, PbSe, and SiGe Nanowires.Jihong Al-Ghalith,Yuxiang Ni,Shiyun Xiong,Sebastian Volz,Traian DumitricaBulletin of the American Physical Society(2016)引用 22|浏览5暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要