Ge-Doped ${\beta }$ -Ga2O3 MOSFETs

IEEE Electron Device Letters(2017)

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摘要
We report on MOSFETs fabricated on Ge-doped β-Ga2O3 homoepitaxial material grown by molecular beam epitaxy on (010) Fe-doped semi-insulating substrates. The Ge-doped channel devices performed similar to previously reported devices with Sn- and Si-doped channels with the drain current ON/OFF ratios of >108 and the saturated drain current of >75 mA/mm at VG = 0 V. Hall effect measurements showed a h...
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关键词
MOSFET,Temperature measurement,Logic gates,Hall effect,Temperature,Substrates,Current measurement
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