Fully Planar 4H-SiC Avalanche Photodiode With Low Breakdown Voltage

IEEE Sensors Journal(2017)

引用 18|浏览61
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摘要
We report on the structure and performance of 4H-SiC p+-n APDs fabricated in a fully planar technology. A dark current density lower than 10 nA/cm2 at 30-V reverse bias and a breakdown voltage of 88 V were observed. A gain as high as 105 was measured at 94-V reverse bias, confirming the avalanche multiplication working condition. The maximum responsivity value was measured at 270 nm, increasing fr...
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关键词
Current measurement,Dark current,Detectors,Avalanche photodiodes,Optical devices,Temperature measurement,Epitaxial layers
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