Work Function Engineering for Performance Improvement in Leaky Negative Capacitance FETs

We analyze the effects of ferroelectric leakage on the performance of a negative capacitance field-effect transistor (NCFET), which has an intermediate metallic layer between the ferroelectric and the high-K dielectric. We show that, when designed without taking the dielectric leakage into account, the NCFET performance can actually degrade significantlywith respect to that of the baseline FET. To...