Dynamic Secondary Ion Mass Spectrometry (SIMS) Imaging of Materials for the Nuclear Industry: Historical Perspectives and Recent Advances

Journal Article Dynamic Secondary Ion Mass Spectrometry (SIMS) Imaging of Materials for the Nuclear Industry: Historical Perspectives and Recent Advances Get access G McMahon, G McMahon University of Manchester, School of Materials, Manchester UK Search for other works by this author on: Oxford Academic Google Scholar BD Miller, BD Miller Naval Nuclear Laboratory, West Mifflin PA, USA Search for other works by this author on: Oxford Academic Google Scholar MG Burke MG Burke University of Manchester, Materials Performance Centre, Manchester UK Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 2208–2209, https://doi.org/10.1017/S1431927617011709 Published: 04 August 2017