Combined Atomic Force Microscopy and Photoluminescence Imaging to Increase the Yield of Quantum Dot Photonic Devices

Luca Sapienza,Jin Liu,Jin Dong Song,Stefan Fält,Werner Wegscheider,Antonio Badolato,Kartik Srinivasan

Frontiers in Optics（2017）

引用 0|浏览15

暂无评分

摘要

We present a combined optical and AFM characterization technique that determines whether single InAs/GaAs quantum dots appear in proximity to (up to micron-sized) topographic surface features that can be detrimental to quantum photonic device performance.

查看译文

关键词

photoluminescence imaging,quantum

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要