Digital post-correction on dynamic nonlinearity in GaN HEMT track-and-hold sampling circuits

Puneet Srivastava
Puneet Srivastava
Xi Yang
Xi Yang

compound semiconductor integrated circuit symposium, pp. 1-4, 2017.

Cited by: 0|Bibtex|Views3|DOI:https://doi.org/10.1109/csics.2017.8240420
Other Links: academic.microsoft.com

Abstract:

This paper introduces the recent development of GaN HEMT track-and-hold sampling circuits (THSCs) with a digital post-correction (DPC) technique for emerging applications. Compared to THSCs in silicon technologies, GaN THSCs achieve 20–30 dB higher signal-to-noise ratio (SNR) for a given bandwidth. Nevertheless, GaN THSCs suffer from dyna...More

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