Investigation of leakage origin of pn diode on free-standing GaN substrate by 3DAP and LACBED methodShigeyoshi Usami,Yoshihiro Sugawara,Yongzhao Yao,Yukari Ishikawa,Norihito Mayama,Kazuya Toda,Yuto Ando,Atsushi Tanaka,Kentaro Nagamatsu,Maki Kushimoto,Manato Deki,Shugo Nitta,Yoshio Honda,Hiroshi AmanoThe Japan Society of Applied Physics(2018)引用 23|浏览8暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要