Error free physically unclonable function with programmed resistive random access memory using reliable resistance states by specific identification-generation method

Po-Hao Tseng
Po-Hao Tseng
Kai-Chieh Hsu
Kai-Chieh Hsu
Feng-Min Lee
Feng-Min Lee
Keh Chung Wang
Keh Chung Wang

Japanese Journal of Applied Physics, 2018.

Cited by: 0|Bibtex|Views14|DOI:https://doi.org/10.7567/jjap.57.04fe04
Other Links: academic.microsoft.com

Abstract:

A high performance physically unclonable function (PUF) implemented with WO3 resistive random access memory (ReRAM) is presented in this paper. This robust ReRAM-PUF can eliminated bit flipping problem at very high temperature (up to 250 °C) due to plentiful read margin by using initial resistance state and set resistance state. It is als...More

Code:

Data:

Your rating :
0

 

Tags
Comments