Atomistic Tight-Binding Study of Contact Resistivity in Si/SiGe PMOS Schottky Contacts

IEEE Transactions on Nanotechnology(2018)

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摘要
The metal-semiconductor contact resistivity has started to play a critical role for the overall device performance as Si is reaching 10-nm size ranges. The International Technology Roadmap for Semiconductors (ITRS) target predicts a requirement of 10-9 Ω·cm2 by 2023 which has been a challenging target to achieve. This paper explores the impact of doping concentration, Schottky barrier height, stra...
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关键词
Conductivity,Doping,Effective mass,Schottky barriers,Semiconductor process modeling,Metals,Crystals
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