Series Resistance Reduction With Linearity Assessment for Vertically Stacked Junctionless Accumulation Mode Nanowire FET
IEEE Transactions on Electron Devices(2018)
摘要
Vertically stacked junctionless accumulation mode (JLAM) nanowire field effect transistors (NWFETs) outperform inversion-mode (IM) NWFETs below 10-nm technology nodes, but the vertical stacking of nanowires (NWs) has a constraint of position dependent drain current. This paper encompasses: 1) extensive investigation of the impact of series resistance on IM, JL mode, and JLAM NWFET architectures; 2...
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关键词
Resistance,Doping,Linearity,Computational modeling,Performance evaluation,Computer architecture,MOSFET
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