Series Resistance Reduction With Linearity Assessment for Vertically Stacked Junctionless Accumulation Mode Nanowire FET

IEEE Transactions on Electron Devices(2018)

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摘要
Vertically stacked junctionless accumulation mode (JLAM) nanowire field effect transistors (NWFETs) outperform inversion-mode (IM) NWFETs below 10-nm technology nodes, but the vertical stacking of nanowires (NWs) has a constraint of position dependent drain current. This paper encompasses: 1) extensive investigation of the impact of series resistance on IM, JL mode, and JLAM NWFET architectures; 2...
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关键词
Resistance,Doping,Linearity,Computational modeling,Performance evaluation,Computer architecture,MOSFET
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