Lockstep Dual-Core ARM A9: Implementation and Resilience Analysis Under Heavy Ion-Induced Soft Errors

IEEE Transactions on Nuclear Science(2018)

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摘要
This paper presents a dual-core lockstep (DCLS) implementation to protect hard-core processors against radiation-induced soft errors. The proposed DCLS is applied to an Advanced RISC Machine Cortex-A9 embedded processor. Different software optimizations were evaluated to assess their impact on performance and fault tolerance. Heavy ions' experiments and fault injection emulation were performed to ...
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关键词
Program processors,Registers,Context,Circuit faults,Field programmable gate arrays,Optimization
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